Automatic Test Equipment Block Diagram

The fundamental task of an ate is to.

Automatic test equipment block diagram. The driver features three active modes. Automatic test equipment components consists of. Automatic test equipment or automated test equipment ate is any apparatus that performs tests on a device known as the device under test dut equipment under test eut or unit under test uut using automation to quickly perform measurements and evaluate the test results. Adcs dacs codecs plls ramdac fire wire fibre channel ethernet.

Cpc7524 block diagram. Automatic test equipment ate industrial controls monitoring. Ate 2 emory nalog ommuni cations igh speed busses igital embedded. Quad high voltage isolated analog switch array.

Automated test equipment ate is computer controlled test and measurement equipment that allows for testing with minimal human interaction. Powerful computer powerful 32 powerful 32 bit bit digital signal processor dsp for analog testing test program written in high test program written in high level level language running on the computer probe head actually touches the bare or packaged chip to perform fault detection. The tested devices are referred to as a device under test dut. High low and terminate as well as a high impedance inhibit state.

This invention relates generally to an automatic test equipment employing an open architecture software framework and methods related thereto. Tida 01050 schematic and block diagram. Automatic test equipment tutorial videos maintaining proficiency and upkeep on multiple automated test stand systems in order to test different systems and subsystems consumes many man hours. Performance and clocking issues typically associated with automatic test equipment.

Background of the invention. With many ate s limited to testing just a single system training personnel and maintaining user knowledge for the multiple ate s required time that. The inhibit state in conjunction with the integrated dynamic clamps facilitates significant attenuation of transmission line reflections when the driver is not actively terminating the line. This design is applicable to any ate system but most applicable to systems requiring a large number of input channels.

Ate system block diagram digital master sequencer digital master sequencer synchro pipe dual master clock dual master clock awg. 1 background is a block diagram illustrating an automatic test equipment ate 10 coupled with an integrated circuit 12. Negative rail input nri rail to rail output rro. The advantages of this kind of testing include reducing testing time repeatability and cost efficiency in high volume.